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Kumada, Takayuki
Purazuma, Kaku Yugo Gakkai-Shi, 96(4), p.176 - 180, 2020/04
We have developed time-resolved reflectivity measurement system using femtosecond laser pulses, which can measure structure of thin films generated by non-thermal effect.
Kumada, Takayuki; Akagi, Hiroshi; Itakura, Ryuji; Otobe, Tomohito; Yokoyama, Atsushi
no journal, ,
We observed oscillation of time-resolved reflectivity of femtosecond-laser-ablated fused silica. We ascribe the oscillation to the interference between probe pulses reflected from a sample surface and a thin layer produced by the photomechanical effect.